FT-330Series ordinary four probe square resistance resistivity tester details introduction
FT-330 Series common four
probe resistance ratio test instrument
Widely applicable
used:
1. Cover film; Conductive polymer film, high and low temperature electric heating film; Thermal insulation, conductive window film, conductive (shielding) cloth, decorative film, decorative paper; Metallized labels, alloy foil films; Melting, sintering, sputtering, coating, coating layers, resistive and capacitive touch screen films; Resistance testing of electrode coatings, other semiconductor materials, and thin film materials
2. Silicon block, chip resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber and other materials, block resistance semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, etc,
3. Thin layer resistance and resistivity of EMI coatings and other substances, conductive paints, conductive pastes, conductive plastics, conductive rubber, conductive films, metal films, etc,
4. Anti static materials, EMI protective materials, conductive fibers, conductive ceramics, etc,
Function Description:
1. Four probe single electric measurement method
2. LCD display, automatic measurement, automatic range, automatic coefficient compensation
3. Integrated circuit system, constant current output
4. Optional: PC software for data management and processing
5. Provide two language operation interface options: Chinese or English
Reference standard:
1. International standard for measuring the resistivity of silicon wafers (ASTM F84)
2. GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals"
3. GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystals using direct current two probe method"4. GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystals by direct current four probe method"
Model and parameters |
Models and technical parameters |
Specification model |
FT-331 |
FT-332 |
FT-333 |
FT-334 |
FT-335 |
FT-336 |
1. Sheet of Block Resistance Range |
resistance |
10-5~2×105Ω/□ |
10-4~2×105Ω/□ |
10-3~2×105Ω/□ |
10-3~2×104Ω/□ |
10-2~2×105Ω/□ |
10-2~2×104Ω/□ |
2. Range of resistivity |
10-6~2×106Ω-cm |
10-5~2×106Ω-cm |
10-4~2×106Ω-cm |
10-4~2×105Ω-cm 10-3~2×106Ω-cm |
10-3~2×105Ω-cm |
Test current range |
Test current |
0.1μA ,1μA,10μA,100µA,1mA,10mA,100mA 10μA,100µA,1mA,10mA,100mA |
0.1μA ,1μA,10μA,100µA,1mA,10mA,100mA |
10μA,100µA,1mA,10mA, |
100mA |
0.1μA,1μA,10μA,100µA,1mA,10mA,100mA |
1μA,10μA,100µA,1mA,10mA,100mA |
4. Current accuracy |
accura |
±0.1% |
±0.2% |
±0.2% |
±0.3% |
±0.3% |
±0.3% |
5. Resistance accuracy |
≤0.3% |
≤0.3% |
≤0.3% |
≤0.5% |
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≤0.5% |
≤0.5% |
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6. Display the reading |
LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity LCD: resistance. resistivity. sheet |
|||||
resistance. temperature. unit conversion.temperature coefficient. current. |
voltage. probe shape. probe spacing. thickness. conductivity |
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7. Testing method: test |
mode General single electrical measurement |
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8. Working power supply |
Input: AC 220V ± 10%. 50Hz power consumption:< 30W 9. Errors |
≤ 4% (Standard Sample results)
1.10. Function selectionto buy
Choose 1. PC software; Choose 2. Square probe; Choose 3. Linear probe; Purchase 4. Testing Platform; 5. Standard resistance
1.pc software; 2. square probe; 3. linear
probe; 4. test Platform.
probe spacing: 1mm; 2mm; 3mm in
needle. white steel needle. gilded copper hemispherical needles.
The calculation and testing principle of the square resistance of thin-layer samples using the four probe method are as follows
:
The layout of the linear four probe test is shown in Figure 8, with adjacent needle distances of S1 S2、S3, According to the principles of physics and electricity:
When the current passes through probes 1 and 4, and probes 2 and 3 test the voltage, the calculation is as follows:
Instrument working principle diagram
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Display interface
Four probe probe
PC
Software interface diagram
Sample Test Report
Steps and processes
1. Turn on the power and preheat for 5 minutes
2. Assemble the probe and testing platform
3. Set the required parameters
4. Measure the sample
5. Export data
Advantages description:
1. Automatic range
2. Dual electric combination testing method
3. Standard resistance calibration instrument
4. Running PC software
5. Simultaneously display resistance, resistivity, and conductivity data
6. Can display 5 significant digits
7. Chinese and English interface
Partial customer cases
Jinan Zhanxiong Electronics Co., Ltd
Qingdao Qidong Electronic Equipment Co., Ltd
Fujian Wanlong Diamond Tools Co., Ltd
Hangzhou Jingxin Coating Packaging Co., Ltd
Dandong Haihao Electronic Technology Co., Ltd
Hangzhou Jingxin Coating Packaging Co., Ltd
South China University of Technology
Far East Foster New Energy Co., Ltd
South University of Science and Technology of China
Fujian Quanzhou Wanlong Industrial Co., Ltd
Suzhou Huanming Electronic Technology Co., Ltd
Shijiazhuang Ordnance Institute
Tianjin Yihengda Technology Co., Ltd
Nanchang Gongjin Technology Co., Ltd
Wood Forest Co., Ltd
Beijing Ruiyi Si Technology Co., Ltd
Zhejiang Napei New Materials Co., Ltd
Shenzhen Zhongke Testing Instrument Electronic Technology Co., Ltd
Ningbo Enmai Intelligent Technology Co., Ltd
Beijing Huiyuan Weiye Technology Co., Ltd
Zhongshan Guangwei Consumer Equipment Co., Ltd
Chengdu Wancheng Technology Co., Ltd
Hebei Dekai Railway Signal Equipment Co., Ltd
Hainan Lenggang Technology Co., Ltd
Zhejiang Shitai Industrial Co., Ltd
1.Nanchang Gongjin Technology Co., LtdShanghai Mengjian Industrial Co., Ltd
2.Beijing Xuedilong Technology Co., Ltd
Yiaopin Imaging Technology Suzhou Co., Ltd
3.anhui normal university
Guangxi Xinghongyuan Technology Co., Ltd
4.Zhejiang Lide Product Technology Co., Ltd
Zhuzhou Megmeet Electric Co., Ltd
5.Jiangyin Zhongxing Optoelectronics Industry Co., Ltd
Jiangsu Yizheng Electronic Tube Co., Ltd
Handheld four probe testerHigh temperature four probe tester