Ningbo Ruike Weiye Instrument Co., Ltd
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FT-330 series ordinary four probe square resistance resistivity tester
FT-330 series ordinary four probe square resistance resistivity tester
Product details

FT-330Series ordinary four probe square resistance resistivity tester details introduction

FT-330 Series common four

probe resistance ratio test instrument

Widely applicable

used:

1. Cover film; Conductive polymer film, high and low temperature electric heating film; Thermal insulation, conductive window film, conductive (shielding) cloth, decorative film, decorative paper; Metallized labels, alloy foil films; Melting, sintering, sputtering, coating, coating layers, resistive and capacitive touch screen films; Resistance testing of electrode coatings, other semiconductor materials, and thin film materials

2. Silicon block, chip resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber and other materials, block resistance semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, etc,

3. Thin layer resistance and resistivity of EMI coatings and other substances, conductive paints, conductive pastes, conductive plastics, conductive rubber, conductive films, metal films, etc,

4. Anti static materials, EMI protective materials, conductive fibers, conductive ceramics, etc,

Function Description:

1. Four probe single electric measurement method

2. LCD display, automatic measurement, automatic range, automatic coefficient compensation

3. Integrated circuit system, constant current output


4. Optional: PC software for data management and processing

5. Provide two language operation interface options: Chinese or English

Reference standard:

1. International standard for measuring the resistivity of silicon wafers (ASTM F84)

2. GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals"


3. GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystals using direct current two probe method"4. GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystals by direct current four probe method"

Model and parameters

Models and technical parameters

Specification model

FT-331

FT-332

FT-333

FT-334

FT-335

FT-336

1. Sheet of Block Resistance Range

resistance

10-5~2×105Ω/□

10-4~2×105Ω/□

10-3~2×105Ω/□

10-3~2×104Ω/□

10-2~2×105Ω/□

10-2~2×104Ω/□

2. Range of resistivity

10-6~2×106Ω-cm

10-5~2×106Ω-cm

10-4~2×106Ω-cm

10-4~2×105Ω-cm

10-3~2×106Ω-cm

10-3~2×105Ω-cm

Test current range

Test current

0.1μA ,1μA,10μA,100µA,1mA,10mA,100mA

10μA,100µA,1mA,10mA,100mA

0.1μA ,1μA,10μA,100µA,1mA,10mA,100mA

10μA,100µA,1mA,10mA,

100mA

0.1μA,1μA,10μA,100µA,1mA,10mA,100mA

1μA,10μA,100µA,1mA,10mA,100mA

4. Current accuracy

accura

±0.1%

±0.2%

±0.2%

±0.3%

±0.3%

±0.3%

5. Resistance accuracy

≤0.3%

≤0.3%

≤0.3%

≤0.5%

≤0.5%

≤0.5%

6. Display the reading

LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity LCD: resistance. resistivity. sheet

resistance. temperature. unit conversion.temperature coefficient. current.

voltage. probe shape. probe spacing. thickness. conductivity

7. Testing method: test

mode

General single electrical measurement

8. Working power supply

Input: AC 220V ± 10%. 50Hz power consumption:< 30W

9. Errors

≤ 4% (Standard Sample results)

1.10. Function selectionto buy

Choose 1. PC software; Choose 2. Square probe; Choose 3. Linear probe; Purchase 4. Testing Platform; 5. Standard resistance

1.pc software; 2. square probe; 3. linear





probe; 4. test Platform.



11. Test probe TestprobeProbe spacing selection: 1mm; 2mm; Three specifications of 3mm; Probe material selection: tungsten carbide needle; White steel needle; Gilded phosphor copper hemispherical needle Optional





probe spacing: 1mm; 2mm; 3mm in



three sizes.Select probe material: tungsten carbide



needle. white steel needle. gilded copper hemispherical needles.




Working principle and calculation formula

The calculation and testing principle of the square resistance of thin-layer samples using the four probe method are as follows

The layout of the linear four probe test is shown in Figure 8, with adjacent needle distances of S1 S2、S3, According to the principles of physics and electricity:

When the current passes through probes 1 and 4, and probes 2 and 3 test the voltage, the calculation is as follows:

Instrument working principle diagram


Whole machine schematic diagram

---

Display interface

Four probe probe

PC

Software interface diagram

Sample Test Report

Steps and processes





1. Turn on the power and preheat for 5 minutes

2. Assemble the probe and testing platform

3. Set the required parameters

4. Measure the sample

5. Export data

Advantages description:

1. Automatic range

2. Dual electric combination testing method

3. Standard resistance calibration instrument

4. Running PC software

5. Simultaneously display resistance, resistivity, and conductivity data

6. Can display 5 significant digits

7. Chinese and English interface

Partial customer cases

Jinan Zhanxiong Electronics Co., Ltd

Qingdao Qidong Electronic Equipment Co., Ltd

Fujian Wanlong Diamond Tools Co., Ltd

Hangzhou Jingxin Coating Packaging Co., Ltd

Dandong Haihao Electronic Technology Co., Ltd

Hangzhou Jingxin Coating Packaging Co., Ltd

South China University of Technology

Far East Foster New Energy Co., Ltd

South University of Science and Technology of China

Fujian Quanzhou Wanlong Industrial Co., Ltd

Suzhou Huanming Electronic Technology Co., Ltd

Shijiazhuang Ordnance Institute

Tianjin Yihengda Technology Co., Ltd

Nanchang Gongjin Technology Co., Ltd

Wood Forest Co., Ltd

Beijing Ruiyi Si Technology Co., Ltd

Zhejiang Napei New Materials Co., Ltd

Shenzhen Zhongke Testing Instrument Electronic Technology Co., Ltd

Ningbo Enmai Intelligent Technology Co., Ltd

Beijing Huiyuan Weiye Technology Co., Ltd

Zhongshan Guangwei Consumer Equipment Co., Ltd

Chengdu Wancheng Technology Co., Ltd

Hebei Dekai Railway Signal Equipment Co., Ltd


Hainan Lenggang Technology Co., Ltd



Zhejiang Shitai Industrial Co., Ltd

1.Nanchang Gongjin Technology Co., LtdShanghai Mengjian Industrial Co., Ltd

2.Beijing Xuedilong Technology Co., Ltd

Yiaopin Imaging Technology Suzhou Co., Ltd

3.anhui normal university

Guangxi Xinghongyuan Technology Co., Ltd

4.Zhejiang Lide Product Technology Co., Ltd

Zhuzhou Megmeet Electric Co., Ltd

5.Jiangyin Zhongxing Optoelectronics Industry Co., Ltd

Jiangsu Yizheng Electronic Tube Co., Ltd




Beijing Sipte Technology Co., Ltd


Sample of Factory Inspection Report


Service Items



Warranty:

12 months, long-term maintenance

Training: Operation Training:

Telephone teaching; USB teaching files; Remote visual communication; On site teaching; Instruction manual and teaching documents

Maintenance and upkeep:

Provide knowledge maintenance and maintenance documents, labels, forms, and maintenance reminders

Verification file:

3Q verification documents, measurement certificates


Extended Services:


Extended warranty service, sample testing service, extended service, instrument rental service


Supporting plan:


Resolve the status of various materials


--Solid state, liquid state, gas state, granular resistance, resistivity, conductivity measurement


Supporting selection plan

Handheld four probe tester
High temperature four probe tester


Online inquiry
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Successful operation!

Successful operation!

Successful operation!